PI (Physik Instrumente) P-733 XYZ piezo nanopositioning stage for AFM and surface metrology | Sensors + Testing Monthly

PI XYZ Piezo Stage Delivers Angstrom-Level Resolution

PI (Physik Instrumente), a global designer and manufacturer of precision motion and nanopositioning technologies, has introduced its P-733 XYZ piezo nanopositioning stage for atomic force microscopy, surface nanometrology, advanced imaging and other applications requiring sub-nanometer positioning. Depending on configuration, the P-733 family provides system resolution down to 0.1 nm, or 1 Å, using capacitive position […]

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GelSights New AI Enhanced Metrology Software Streamlines Integration 1200x628 1 • Sensors + Testing Monthly

GelSight Introduces AI-Enhanced Metrology Software Upgrade

The Waltham, Massachusetts-based GelSight, industry experts in tactile intelligence technology, have announced the release of its GelSight Mobile™ 3.7 software package upgrade. This latest software update introduces APIs that enable users to integrate GelSight’s tactile sensing capabilities into factory automation processes, robotics systems, and other comprehensive solutions. Additionally, GelSight Mobile 3.7 expands global usability with […]

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