PI (Physik Instrumente), a global designer and manufacturer of precision motion and nanopositioning technologies, has introduced its P-733 XYZ piezo nanopositioning stage for atomic force microscopy, surface nanometrology, advanced imaging and other applications requiring sub-nanometer positioning. Depending on configuration, the P-733 family provides system resolution down to 0.1 nm, or 1 Å, using capacitive position feedback and frictionless flexure guidance.

PI (Physik Instrumente) P-733 XYZ piezo nanopositioning stage for AFM and surface metrology | Sensors + Testing Monthly

PI’s P-733 XYZ piezo nanopositioning stage delivers sub-nanometer three-axis positioning for AFM, surface metrology, super-resolution microscopy and advanced imaging applications.

The standard P-733 configurations provide XYZ travel ranges of up to 100 × 100 × 10 µm for precision sample scanning and measurement. A 50 × 50 mm clear aperture supports transmitted-light microscopy and other optical imaging techniques, while capacitive position sensors provide closed-loop feedback without mechanical contact. PI specifies a typical linearity error of 0.03%, together with zero-play flexure guides designed to eliminate friction, backlash and mechanical wear.

For applications requiring higher scanning speeds and shorter settling times, the P-733.3DD direct-drive configuration provides 30 × 30 × 10 µm travel with typical 0.1 nm system resolution in X, Y and Z. The higher-stiffness design has an unloaded resonant frequency of approximately 1.2 kHz in X, supporting faster dynamic scanning and positioning than the longer-travel configurations.

The stage architecture uses parallel kinematics and parallel metrology, with all motion axes referenced to a common fixed point. This allows for active compensation of unwanted axis crosstalk and guiding errors while maintaining nanometer-range tracking accuracy during dynamic operation. For AFM, microscopy and surface characterization applications, this approach can help maintain coordinated XYZ positioning as samples are scanned across multiple axes.

PICMA multilayer piezo actuators provide the stage drive, while the flexure-guided architecture eliminates sliding or rolling mechanical elements within the positioning mechanism. Ultra-high-vacuum-compatible and nonmagnetic configurations are also available for applications requiring specialized operating environments.

The P-733 is intended for applications including super-resolution and confocal microscopy, AFM, surface characterization, wafer positioning and metrology, nanoimprinting, micromanipulation, precision optics and image stabilization. The combination of sub-nanometer positioning, multi-axis motion and optical access is designed for measurement and imaging systems where positional stability and repeatability directly affect measurement quality.

About PI (Physik Instrumente)

PI (Physik Instrumente) is a privately held precision motion and automation technology company specializing in nanopositioning, piezoelectric motion systems, air bearing stages, precision gantries, parallel-kinematic hexapods and advanced motion control. Founded more than 50 years ago, PI develops and manufactures precision positioning technologies across facilities in North America, Europe and Asia and employs more than 1,900 professionals worldwide. Its technologies support applications across semiconductor manufacturing and metrology, photonics, microscopy and life sciences, industrial automation, aerospace and scientific research. PI’s U.S. headquarters is located in Shrewsbury, Massachusetts, where the company opened an approximately 140,000-square-foot manufacturing and engineering facility in 2025. For more information, please click here.

Source/Photo Credit: Physik Instrumente (PI)

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Molly Bakewell Chamberlin
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